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Publicado por Prentice Hall, 1990
ISBN 10: 0132150883ISBN 13: 9780132150880
Librería: HPB-Red, Dallas, TX, Estados Unidos de America
Libro
Hardcover. Condición: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!.
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Usado desde EUR 3,80
Publicado por Morgan Kaufmann, 2000
ISBN 10: 0124343708ISBN 13: 9780124343702
Librería: KuleliBooks, Phoenix, AZ, Estados Unidos de America
Libro
Condición: Good. The book may have minor cosmetic wear (i.e. creased spine/cover, scratches, curled corners, folded pages, minor sunburn, minor water damage, minor bent). The book may have some highlights/notes/underlined pages - Accessories such as CD, codes, toys, may not be included - Safe and Secure Mailer - No Hassle Return.
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Nuevo desde EUR 26,35
Usado desde EUR 5,98
Encuentre también Tapa dura
Publicado por Pearson College Div, 1995
ISBN 10: 0023671718ISBN 13: 9780023671715
Librería: HPB-Red, Dallas, TX, Estados Unidos de America
Libro
hardcover. Condición: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!.
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Usado desde EUR 9,54
Publicado por McGraw-Hill Companies, 2019
ISBN 10: 1260123111ISBN 13: 9781260123111
Librería: ThriftBooks-Dallas, Dallas, TX, Estados Unidos de America
Libro
Paperback. Condición: Very Good. No Jacket. May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less 0.4.
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Nuevo desde EUR 36,41
Usado desde EUR 13,78
Encuentre también Tapa blanda Original o primera edición
Publicado por Prentice Hall, 1985
ISBN 10: 0133082482ISBN 13: 9780133082487
Librería: Reuseabook, Gloucester, GLOS, Reino Unido
Libro
Paperback. Condición: Used; Good. Dispatched, from the UK, within 48 hours of ordering. This book is in good condition but will show signs of previous ownership. Please expect some creasing to the spine and/or minor damage to the cover. Aged book. Tanned pages and age spots, however, this will not interfere with reading.
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Usado desde EUR 5,97
Publicado por B.S. Publications B S Pub., 2003
ISBN 10: 8178000393ISBN 13: 9788178000398
Librería: Books Puddle, New York, NY, Estados Unidos de America
Libro
Condición: Used. pp. 286.
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Usado desde EUR 19,59
Publicado por BS Pub, 2015
ISBN 10: 8178000385ISBN 13: 9788178000381
Librería: Vedams eBooks (P) Ltd, New Delhi, India
Libro
Soft cover. Condición: New. Contents 1. Basic concepts of reliability. 2. Faults in digital circuits. 3. Test generation. 4. Fault tolerant design of digital systems. 5. Self checking and fail safe logic. 6. Design for testability. 7. Conclusion. Appendix Markov Models. Reference. Annotated bibliography. Index. Fault Tolerance and Testability have the common objective of improving the reliability of computer hardware. This book has been written for the students of Electrical Engineering and Computer Sciences. Chapter 1 deals with the basics of reliability theory chapter 2 covers most of the important faults chapter 3 about fault detection chapter 4 discusses many classes of hardware fault tolerance techniques chapter 5 presents recent developments chapter 6 focuses on various design techniques and chapter 7 highlights the current research issues. The entire text is prepared in lucid language with sufficient basic techniques and examples for easy understanding. Features A systematic study of the various fault tolerant architectures in use. An in depth review of the basic characteristics of self checking logic detailed descriptions of all the major hardware techniques that may be used in fault tolerant and testable design. Comparisons of the various possible techniques for dealing with a problem and assessment of their suitability in various situations. Sections on the fault tolerant design of VLSI chips and state of the art problems still being researched over 200 line drawings and tables. Extensive references at the end of each chapter to facilitate further reading on specialist topics. An annotated bibliography listing textbooks journal articles and conference proceedings on the subject. 264 pp.
Publicado por Morgan & Claypool, 2009
ISBN 10: 1598293508ISBN 13: 9781598293500
Librería: BookOrders, Russell, IA, Estados Unidos de America
Libro
Soft Cover. Condición: Good. Ex-library with the usual features. Library label on front cover. The interior is clean and tight. Binding is good. Cover shows light wear. Ex-Library.
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Usado desde EUR 28,48
Publicado por Academic Press Inc, 1997
ISBN 10: 0124343309ISBN 13: 9780124343306
Librería: Anybook.com, Lincoln, Reino Unido
Libro
Condición: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,600grams, ISBN:9780124343306.
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Nuevo desde EUR 239,12
Usado desde EUR 24,19
Encuentre también Tapa dura
Publicado por Springer International Publishing Okt 2008, 2008
ISBN 10: 3031797841ISBN 13: 9783031797842
Librería: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Alemania
Libro Impresión bajo demanda
Taschenbuch. Condición: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips.Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References 112 pp. Englisch.
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Nuevo desde EUR 29,95
Publicado por Machinery Industry Press, 2020
ISBN 10: 7111666291ISBN 13: 9787111666295
Librería: liu xing, Nanjing JiangSu, JS, China
Libro
paperback. Condición: New. Language:Chinese.Paperback. Pub Date: 2020-11-01 Pages: 212 Publisher: Machinery Industry Press This book introduces the concept and working principle of quantum information processing systems in a clear and practical way.?It covers the basics of quantum mechanics. quantum information processing. quantum gates and circuits. quantum error correction. quantum algorithms. and quantum cryptography. It is especially suitable for readers who have no prior knowledge of quantum mechanics and who are .
Publicado por Morgan Kaufmann Publishers, 2001
Librería: Books in my Basket, New Delhi, India
Libro
Hardcover. Condición: New. ISBN:9780124343702.
Publicado por Wiley-Interscience, 2007
ISBN 10: 0470072962ISBN 13: 9780470072967
Librería: Lucky's Textbooks, Dallas, TX, Estados Unidos de America
Libro
Condición: New.
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Nuevo desde EUR 156,61